Structural Analysis of Thin Films using X-Ray Diffraction Techniques. International Journal of Engineering & Extended Technologies Research (IJEETR), [S. l.], v. 3, n. 1, p. 2464–2467, 2021. DOI: 10.15662/IJEETR.2021.0301002. Disponível em: https://www.ijeetr.com/index.php/ijeetr/article/view/22. Acesso em: 5 dec. 2025.